Search results for Physical+sciences+%3e+Testing+equipment

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Wafer alignment with AFM metrology
Background One of the major challenges in nanoscale manufacturing is defect control. Optical inspection is not an option at the nanoscale level due to the diffraction limit of light, and without inspection high scrap rates can occur. One solution to this problem is inline metrology using atomic force microscopes (AFM). Single chip MEMS based AFMs have...
Tunable ionization platform
Background Different molecules have different ionization energies. Commercially available photo-ionization detectors (PIDs) emit light to ionize the molecules of interest. However, these PIDs require distinct lamps dependent upon the ionization energy required. In fact there are four types of lamps available, each with a different, fixed ionization...
Detection of single nanoparticle collisions by electrocatalytic amplification
TechnologyCurrent detector/sensor technology has been used to detect the presence of molecules in substances quickly and with relatively high sensitivity. Conventional technology allows for this quick analysis when the substance being testing for is present in relatively high amounts. Analyzing particle size distributions of nanoparticles typically...
Wireless corrosion detection sensors
ProblemCorrosion of steel reinforcements in concrete structures present one of the most important durability problems facing bridges and related infrastructures. Monitoring this corrosion is difficult since the embedded steel is not visible to the naked eye. Detection techniques, such as acoustic, ultrasonic and radar, have proved to be limited in this...
Independently actuated AFM probes for nanoscale measurement
Background The development of accurate surface imaging is key to implementing an effective metrology strategy to manage defect detection in high volume electronic device fabrication. Measurement of manufacturing processes can be performed either in-line, as part of the manufacturing process, or off-line in a separate process. Unfortunately, no methods...