Search results for Physical+sciences+%3e+Testing+equipment

7 result(s) Sort by:
Detection of single nanoparticle collisions by electrocatalytic amplification
TechnologyCurrent detector/sensor technology has been used to detect the presence of molecules in substances quickly and with relatively high sensitivity. Conventional technology allows for this quick analysis when the substance being testing for is present in relatively high amounts. Analyzing particle size distributions of nanoparticles typically...
Wireless corrosion detection sensors
ProblemCorrosion of steel reinforcements in concrete structures present one of the most important durability problems facing bridges and related infrastructures. Monitoring this corrosion is difficult since the embedded steel is not visible to the naked eye. Detection techniques, such as acoustic, ultrasonic and radar, have proved to be limited in this...
Optical control of nanoparticles on solid substrates
Background Colloidal particles are becoming an increasingly prevalent feature in many emerging technologies. The ability to control these particles and construct them into desired nanostructures for functional devices is necessary to realize their benefits in real-world applications. Many existing technologies to control colloidal particles function...
Independently actuated AFM probes for nanoscale measurement
Background The development of accurate surface imaging is key to implementing an effective metrology strategy to manage defect detection in high volume electronic device fabrication. Measurement of manufacturing processes can be performed either in-line, as part of the manufacturing process, or off-line in a separate process. Unfortunately, no methods...
Tunable ionization platform
Background Different molecules have different ionization energies. Commercially available photo-ionization detectors (PIDs) emit light to ionize the molecules of interest. However, these PIDs require distinct lamps dependent upon the ionization energy required. In fact there are four types of lamps available, each with a different, fixed ionization...
Wafer alignment with AFM metrology
Background One of the major challenges in nanoscale manufacturing is defect control. Optical inspection is not an option at the nanoscale level due to the diffraction limit of light, and without inspection high scrap rates can occur. One solution to this problem is inline metrology using atomic force microscopes (AFM). Single chip MEMS based AFMs have...
Broad access to nanoscale technologies
Background Miniaturization, or “small tech,” has revolutionized the world we live in today. It has transformed computers from gigantic rooms to the size of our palms, changed displays from being too bulky to carry to being wrappable like a plastic sheet, and allowed sensors to be ubiquitously present in our everyday lives, to name a few....